颁布单位：[University of Michigan] |  颁布时间：2011 |  实施时间：2011 |  学科分类：[System Identification, Fault Detection and Isolation, Sensor, Mechanical Engineering, Engineering, Mechanical Engineering]

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颁布单位：[University of Michigan] |  颁布时间：2011 |  实施时间：2011 |  学科分类：[VLSI Circuit Reliability, Bias Temerature Instability (BTI), Gate-oxide Wear-out, Sensor, Dynamic Reliability Management, In Situ Sensing, Electrical Engineering, Engineering, Electrical Engineering]

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