Proton Testing of nVidia Jetson TX2

[摘要] Single-Event Effects (SEE) testing was conducted on the nVidia Jetson TX2 System on Chip (SOC). Testing was conducted at Massachusetts General Hospital's (MGH) Francis H. Burr Proton Therapy Center on June 2nd, 2019.

[发布日期] 2019-07-22

[学科分类] 电子与电气工程

[关键词] CHIPS;PROTONS;RADIATION EFFECTS;ERRORS;FAILURE ANALYSIS;RELIABILITY ANALYSIS;CENTRAL PROCESSING UNITS