NASA Goddard Space Flight Center's Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results
[摘要] Total ionizing dose, displacement damage dose, and single-event effect testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, bipolar devices, and FPGAs.
[发布日期] 2019-07-08 [发布机构]
[效力级别] [学科分类] 电子与电气工程
[关键词] COMMERCIAL OFF-THE-SHELF PRODUCTS;EXTRATERRESTRIAL RADIATION;GROUND TESTS;PROTON DAMAGE;SINGLE EVENT EFFECTS (SEE);SPACECRAFT ELECTRONIC EQUIPMENT;TOTAL IONIZING DOSE [时效性]
