Development of X-Ray Computed Tomography Image Quality Indicators, "IQIs"

[摘要] The intent of this effort, which is funded through the NASA OSMA NDE Program, is to develop a methodology and tools to assess Computed Tomography (CT) system performance. In particular, our team has fabricated Image Quality Indicators (IQIs) using materials and internal features useful for assessing CT detectability limits, contrast sensitivity, and resolution. Unlike traditional 2D radiography IQIs, those for CT should be more conducive to volumetric datasets and of uniform aspect ratio cross-sections.

[发布日期] 2018-11-09

[学科分类] 航空航天科学

[关键词] ADDITIVE MANUFACTURING;X RAYS;COMPUTER AIDED TOMOGRAPHY;IMAGE RESOLUTION;CONTRAST;PROVING;LITHOGRAPHY;INSERTS;NONDESTRUCTIVE TESTS;FABRICATION;SENSITIVITY