Sensitivity Analysis of the DARHT-II 2.5MV/2kA Diode

[摘要] This report summarizes the study of the tolerance limits on the assembly of the cathode and the Pierce electrode for the DARHT-II diode (2.5 MV, 2 kA case), performed through a series of computer simulations using the PIC code WARP [1]. We have considered sources of beam quality degradation like the errors in axial and transverse positioning, and the size of the radial gap between the cathode and the Pierce electrode (shroud). The figure of merit was chosen to be the RMS beam (edge) emittance at a distance of 1 meter from the cathode, as defined by {var_epsilon}{sub x} = 4 {beta}{gamma} {radical}(-{sup 2}) {center_dot}. The analysis shows that to position the cathode at the correct axial and transverse location is more important than the size of the radial gap.

[发布日期] 2006-12-22 [发布机构] Lawrence Berkeley National Laboratory

[关键词] Cathodes;Electrodes;Sensitivity Analysis;32;Computerized Simulation