Superconductivity in amorphous RexZr (x≈6) thin films
[摘要] We report the growth, characterization and superconducting properties of thin films of a new amorphous superconductor, RexZr ( x asymptotic to 6). Films were grown by pulsed laser deposition with the substrate kept at room temperature. Films with thicknesses larger than 40 nm showed a superconducting transition temperature (Tc) of 5.9 K. Superconducting properties were measured for films with varying thickness from 120 to 3 nm. The normal state resistance scaled linearly with the inverse of thickness. The transition temperature, critical field, coherence length, penetration depth and superconducting energy gap changed marginally with decreasing film thickness down to 8 nm. Scanning tunneling spectroscopy and penetration depth measurements provide evidence for a single gap strong coupling s-wave superconductor. (c) 2021 Elsevier B.V. All rights reserved.
[发布日期] 2021-10-05 [发布机构]
[效力级别] [学科分类]
[关键词] Amorphous superconductor;Thin film;Superconducting energy gap;Penetration depth [时效性]