Laterally resolved measurement of interaction forces between surfaces that are partly covered with polyelectrolytes

[摘要] The adsorption of polycation poly(diallyldimethylammonium chloride), PDADMAC for short, on oxidized silicon wafers is investigated by direct force measurements using an atomic force microscope. It is shown that the electrostatic forces as well as the adhesive properties are significantly influenced by adsorbed PDADMAC. By using force mapping and monitoring the increased adhesion between the surfaces the adsorbed polymer can be two-dimensionally monitored on the surface. Different coverages of the polycation were investigated, which qualitatively agree well with results of XPS and electrokinetic measurements. (C) 1998 Academic Press.

[发布日期] 1998-12-01

[关键词] atomic force microscope;force mapping;interaction forces;polyelectrolyte adsorption;interfaces