THE INFLUENCE OF TRANSMUTATION, VOID SWELLING, AND FLUX SPECTRA UNCERTAINTIES ON THE ELECTRICAL-PROPERTIES OF COPPER AND COPPER-ALLOYS

[摘要] A comparison of the predicted and measured electrical conductivities of MARZ copper and two copper alloys irradiated in FFTF shows that the calculated transmutation rates agree within 15% with those required to produce the observed changes. It also appears that the contribution of transmutants and void swelling to conductivity changes are directly additive. Of the three models studied, Euken's model has been found to best describe the contribution of void swelling to conductivity loss.

[发布日期] 1994-09-01

[效力级别]  Proceedings Paper