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STRUCTURAL AND MAGNETIC CHARACTERIZATION OF VERY THIN CO-CR FILMS
[摘要] In this paper we describe the nucleation and growth of thin Co-Cr layers on different substrates and seedlayers. Especially the presence and formation of the initial layer is considered, and corresponding growth mechanisms are proposed. The magnetic properties of these layers have been analyzed by in-plane VSM and by anomalous Hall effect (AHE) measurements. Even layers as thin as 5 nm are shown to exhibit a perpendicular magnetic anisotropy. For a high coercive Co-Cr film the formation of dot-like domains is shown by the Bitter-colloid/SEM technique.
[发布日期] 1992-07-01 [发布机构] 
[效力级别]  Proceedings Paper [学科分类] 
[关键词]  [时效性] 
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