On the surface mapping using individual cluster impacts

[摘要] This paper describes the advantages of using single impacts of large cluster projectiles (e.g., C-60 and Au-400) for surface mapping and characterization. The analysis of co-emitted time-resolved photon spectra, electron distributions and characteristic secondary ions shows that they can be used as surface fingerprints for target composition, morphology and structure. Photon, electron and secondary ion emission increases with the projectile cluster size and energy. The observed, high abundant secondary ion emission makes cluster projectiles good candidates for surface mapping of atomic and fragment ions (e.g., yield >1 per nominal mass) and molecular ions (e.g., few tens of percent in the 500 < m/z < 1500 range). (C) 2011 Elsevier B.V. All rights reserved.

[发布日期] 2012-02-15

[效力级别]  Proceedings Paper

[关键词] Photon emission;Electron emission;Secondary ion yield;Cluster-SIMS