A design for a pinhole scanning helium microscope

[摘要] We present a simplified design for a scanning helium microscope (SHeM) which utilises almost entirely off the shelf components. The SHeM produces images by detecting scattered neutral helium atoms from a surface, forming an entirely surface sensitive and non-destructive imaging technique. This particular prototype instrument avoids the complexities of existing neutral atom optics by replacing them with an aperture in the form of an ion beam milled pinhole, resulting in a resolution of around 5 microns. Using the images so far produced, an initial investigation of topological contrast has been performed. (C) 2014 Elsevier B.V. All rights reserved.

[发布日期] 2014-12-01

[效力级别]  Proceedings Paper

[关键词] Helium atom scattering;Helium atom microscopy;Scanning helium microscope;SHeM