Energy- and angle-dependent trends in the trapping probability of O+ incident on Cu(001)

[摘要] We have measured the trends in the trapping probability of 5-600 eV O+ ions incident on Cu(0 0 1) at 45 degrees and along the sample normal. The trapping probabilities, measured using Auger Electron Spectroscopy (AES), depend strongly on the incident ion energy, but not on the incident angle. Significant differences are observed between these trends and those previously measured for Na+ incident on Cu(0 0 1) over a similar range of energies and angles, particularly for the 45 degrees angle of incidence. We conclude that these observations reflect differences in the ion-surface scattering potentials. (C) 1999 Elsevier Science B.V. All rights reserved.

[发布日期] 1999-08-01

[效力级别]  Proceedings Paper

[关键词] ion-surface impact;ion trapping;metal surfaces;trapping probability