KINETIC ROUGHENING OF VICINAL SI(001)

[摘要] The kinetic roughening behavior of vicinal Si(001) surfaces is studied with scanning tunneling microscopy. By analyzing the height-height correlation function of the Si layers that have been grown we found, in the case of islands growth, an algebraic roughening behavior with a roughness exponent of 0.68 +/- 0.05. In the step flow mode, however, we found non-algebraic roughening behavior.

[发布日期] 1994-05-10