Comment on Formation and atomic structures of double-layer steps on Si(100) surfaces studied by scanning tunneling microscope by H.Q. Yang, C.X. Zhu, J.N. Gao, Z.Q. Xue, S.J. Pang [Surface Science 429 (1999) L481-L485]
[摘要]
[发布日期] 2000-03-20 [发布机构]
[效力级别] [学科分类]
[关键词] scanning tunneling microscopy;silicon;single crystal surfaces [时效性]
