ELLIPSOMETRY AND ELECTRON-DIFFRACTION STUDY OF ANODICALLY FORMED PD OXIDE LAYERS

[摘要] Anodic Pd oxide films grown in 1 M H2SO4 and 1 M HClO4 during the time tau (15 s less-than-or-equal-to tau less-than-or-equal-to 9000s) at the potential E(tau)(1.90 V less-than-or-equal-to E(tau) less-than-or-equal-to 2.06 V) have been investigated by ellipsometry and electron diffraction techniques. Ellipsometry confirms the duplex structure of the anodic Pd oxide films earlier concluded from electrochemical data. Electron diffraction reveals epitaxial growth of PdO on Pd at early stages. The film thickness fits a logarithmic growth rate equation for oxide layer thicknesses greater than 10-20 nm, depending on the solution composition.

[发布日期] 1993-10-12

[效力级别]  Proceedings Paper