PHASE-CONTRAST SURFACE-MODE RESONANCE MICROSCOPY

[摘要] A simple method is described which allows to obtain a phase sensitive image in surface mode resonance microscopy. It exploits the fact that surface mode resonances couple only to one direction of polarization (s or p) so that the other direction (p or s) can be used as a reference wave. Using a Soleil-Babinet compensator and a polarizer, the two waves can be phase shifted with respect to each other and superimposed before they are imaged onto a camera chip. The method is demonstrated experimentally. Possible applications are discussed, especially for the field of nonlinear optics of thin films and surfaces, where phase information is particularly desirable.

[发布日期] 1994-11-01