Measurement in-plane deformations in electronic speckle pattern interferometry using phase-shifting modulated by polarization

[摘要] We propose to combine electronic speckle pattern interferometry with polarizing phase-shifting techniques to measure in-plane displacement fields. We present the technical and theoretical procedures for its implementa-tion, added with the necessary calibration procedures employing a commercial polarimeter. Finally, we tested our proposal experimentally using a two-phase step algorithm to measure in-plane displacements on a latex sample.

[发布日期] 2021-11-01

[关键词] Electronic speckle pattern interferometry;Optical metrology;Phase shifting;In-plane displacement;interferometry