Near-field Raman microscopy

[摘要] Near-field microscopy offers the power of optical characterization with nanometer spatial resolution (similar to 15 nm). Combining tip-enhanced microscopy with Raman scattering spectroscopy results in the ability to localize distinct spectral features, providing a unique opportunity to characterize materials on length scales of a few nanometers using visible light.

[发布日期] 2005-05-01