Growth and characterization of lead sulfide films deposited on glass substrates

[摘要] Lead sulfide (PbS) films have been deposited by chemical deposition on a glass substrate. Microstructure characterization was carried out by X-ray diffraction and scanning electron microscopy in order to determine the average crystallite size (15 nm) and study the surface morphologies of the as-deposited and heat-treated films. The PbS films obtained had p-type conductivity and low resisitivity (5 Omega cm). The carrier density, Hall mobility and mean free path of carriers in PbS films were in the range 2.5x10(17) cm(-3), 5 cm(2)/V s and 0.642 mum, respectively. (C) 2001 Elsevier Science Ltd. All rights reserved.

[发布日期] 2001-11-01

[效力级别]  Proceedings Paper

[关键词] microstructure;electrical properties;film composition;thermal stability