Electrical resistivity of Ti-Ni binary and Ti-Ni-X (X = Fe, Cu) ternary shape memory alloys
[摘要] The electrical resistivities of Ti-Ni binary and Ti-Ni-X (X = Fe, Cu) ternary shape memory alloys (SMAs) are investigated. Experimental results reveal that the Ti-Ni and Ti-Ni-X SMAs exhibit different electrical resistivity (p) characteristics due to their different martensitic transformation behaviors. The increase of rho during the B2 -> R transformation of Ti-Ni SMAs is about 10-16 mu Omega cm, which is a change of about 12-20%. For a two-stage transformation of B2 <-> R <-> B19', there is a sharp increase of rho during B2 -> R transformation, and then a rapid decrease of rho during R -> B19' transformation. However, for the Ti-40 at.%,Ni-10 at.%,Cu alloy, which exhibits a B2 <-> B19 <-> B19' two-stage transformation, there is a small variation of p during B2 -> B 19 transformation, but a significant variation of rho during B19 -> B19' transformation. These phenomena may be ascribed to their different structures, deformation defects, accommodated twin variants and crystal distortions. (c) 2006 Elsevier B.V. All rights reserved.
[发布日期] 2006-12-25 [发布机构]
[效力级别] Proceedings Paper [学科分类]
[关键词] Ti-Ni shape memory alloys;electrical resistivity;martensitic transformation [时效性]