Scanning electron microscope - The right tool for smear layer analysis?

[摘要] I read with great interest the article entitled, “Effect of sonicirrigation activation at different frequencies in smear layerremoval; an in vitro experimental study” by Aalmohamedet al., which has been published in your esteemed journal.[1]Even though the study was well performed, I would liketo share my thoughts on the technique used to analyzethe presence or absence of smear layer. The current studyused conventional scanning electron microscope (SEM)for smear layer analysis. However, SEM model is not asound, reproducible, and valid one. Ideally, a longitudinalobservation of the canal using micro‑computed tomographyis regarded a fundamental requirement to study the smearlayer removal procedures. Thus, the SEM analysis forsmear layer removal which does not allow this longitudinalobservation of dentinal morphology compromises thecredibility of the results.[2] Further, in the current study,the samples were not anatomically matched. Knowing thatthe instruments used to shape the canals touch only 50%of the canal walls,[3,4] what was the guarantee that the areasimaged in SEM had a smear layer to begin with? To mitigatethis problem, a split tooth model using e‑SEM would havebeen more appropriate.

[学科分类] 口腔科学