Two dynamic modes to streamline challenging atomic force microscopy measurements

[摘要] The quality of topographic images obtained using atomic force microscopy strongly depends on the accuracy of the choice of scanning parameters. When using the most common scanning method – semicontact amplitude modulation (tapping) mode, the choiceof scanning parameters is quite complicated, since it requires taking into account many factors and finding the optimal balance between them. A researcher’s task can be significantly simplified by introducing new scanning techniques. Two such techniques aredescribed: vertical and dissipation modes. Significantly simplified and formalized choice of the imaging parameters in these modesallows addressing a wide range of formerly challenging tasks – from scanning rough samples with high aspect ratio features to molecular resolution imaging.

[学科分类] 环境监测和分析

[关键词] atomic force microscopy;dissipation mode;scanning probemicroscopy;vertical mode