Thermal scanning probe lithography using Parylene C as thermal resist
[摘要] Thermal scanning probe lithography is a direct-write patterning method that uses a heated scanning probe tip to remove thermal resist. The most widely used thermal resist is polyphthalaldehyde. Another alternative thermal resist, Parylene C is introduced in this letter. It has been found that Parylene C has a wide process latitude as a thermal resist under our experimental conditions. A high resolution of ∼40 nm can be achieved in our optimised process. In addition, patterns in parylene layer can be transferred directly into the substrate with deep reactive ion etching without an additional hard mask, thus simplifying the fabrication process.
[发布日期] [发布机构]
[效力级别] [学科分类] 计算机科学(综合)
[关键词] nanofabrication;nanolithography;nanostructured materials [时效性]