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High-temperature relaxor ferroelectric behavior in pr-doped SrTiO(3)
[摘要] Temperature-dependent Raman scattering, dielectric, and powder x-ray diffraction studies have been carried out on Pr-doped SrTiO(3) ceramic samples. Activation of TO(2) and TO(4) polar modes indicated increasing degree of polar distortion by Pr doping. Dielectric measurements revealed that the system exhibits dielectric relaxation peaks at similar to 500 K. The softening tendency of the polar TO(1) soft mode decreases with increasing Pr doping. X-ray diffraction results show no evidence of symmetry breaking across the dielectric peak temperatures. The system exhibits features of high-temperature relaxor ferroelectrics.
[发布日期] 2007-12-01 [发布机构] 
[效力级别]  [学科分类] 
[关键词] ANTIFERROELECTRIC PHASE-TRANSITION;1ST-ORDER RAMAN-SCATTERING;SOFT PHONON MODES;THIN-FILMS;SR1-XCAXTIO3;(SR1-XCAX)TIO3;PEROVSKITE;CRYSTALS;DYNAMICS;GLASSES [时效性] 
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