Sensitivity of VIIRS Polarization Measurements

[摘要] The design of an optical system typically involves a sensitivity analysis where the various lens parameters, such as lens spacing and curvatures, to name two parameters, are (slightly) varied to see what, if any, effect this has on the performance and to establish manufacturing tolerances. A sinular analysis was performed for the VIIRS instruments polarization measurements to see how real world departures from perfectly linearly polarized light entering VIIRS effects the polarization measurement. The methodology and a few of the results of this polarization sensitivity analysis are presented and applied to the construction of a single polarizer which will cover the VIIRS VIS/NIR spectral range. Keywords: VIIRS, polarization, ray, trace; polarizers, Bolder Vision, MOXTEK

[发布日期] 2010-08-01

[学科分类] 原子、分子光学和等离子物理