An Investigation of the Electrical Short Circuit Characteristics of Tin Whiskers

[摘要] In this experiment, an empirical model to quantify the probability of occurrence of an electrical short circuit from tin whiskers as a function of voltage was developed. This model can be used to improve existing risk simulation models FIB and TEM images of a tin whisker confirm the rare polycrystalline structure on one of the three whiskers studied. FIB cross-section of the card guides verified that the tin finish was bright tin.

[发布日期] 2008-01-01

[学科分类] 电子与电气工程