Investigation of Current Spike Phenomena During Heavy Ion Irradiation of NAND Flash Memories

[摘要] A series of heavy ion and laser irradiations were performed to investigate previously reported current spikes in flash memories. High current events were observed, however, none matches the previously reported spikes. Plausible mechanisms are discussed.

[发布日期] 2011-07-27

[学科分类] 电子与电气工程