Defect Depth Measurement Using White Light Interferometry

[摘要] The objectives of the White Light Interferometry project are the following: (1) Demonstrate a small hand-held instrument capable of performing inspections of identified defects on Orbiter outer pane window surfaces. (2) Build and field-test a prototype device using miniaturized optical components. (3) Modify the instrument based on field testing and begin the conversion of the unit to become a certified shop-aid.

[发布日期] 2009-01-01

[学科分类] 航空航天科学