Analysis of the Radiated Field in an Electromagnetic Reverberation Chamber as an Upset-Inducing Stimulus for Digital Systems

[摘要] Preliminary data analysis for a physical fault injection experiment of a digital system exposed to High Intensity Radiated Fields (HIRF) in an electromagnetic reverberation chamber suggests a direct causal relation between the time profile of the field strength amplitude in the chamber and the severity of observed effects at the outputs of the radiated system. This report presents an analysis of the field strength modulation induced by the movement of the field stirrers in the reverberation chamber. The analysis is framed as a characterization of the discrete features of the field strength waveform responsible for the faults experienced by a radiated digital system. The results presented here will serve as a basis to refine the approach for a detailed analysis of HIRF-induced upsets observed during the radiation experiment. This work offers a novel perspective into the use of an electromagnetic reverberation chamber to generate upset-inducing stimuli for the study of fault effects in digital systems.

[发布日期] 2012-12-01

[学科分类] 电子与电气工程