A Robust Strategy for Total Ionizing Dose Testing of Field Programmable Gate Arrays

[摘要] We present a novel method of FPGA TID testing that measures propagation delay between flip-flops operating at maximum speed. Measurement is performed on-chip at-speed and provides a key design metric when building system-critical synchronous designs.

[发布日期] 2012-07-16

[学科分类] 电子与电气工程