Single Event Testing on Complex Devices: Test Like You Fly versus Test-Specific Design Structures

[摘要] We present a framework for evaluating complex digital systems targeted for harsh radiation environments such as space. Focus is limited to analyzing the single event upset (SEU) susceptibility of designs implemented inside Field Programmable Gate Array (FPGA) devices. Tradeoffs are provided between application-specific versus test-specific test structures.

[发布日期] 2014-03-31

[学科分类] 电子与电气工程