Heavy-Ion Testing of the Freescale Qorivva 32-bit Automotive-Grade MCU

[摘要] We present single-event effects testing results from a commercially-available automotive microcontroller. We discuss the difficulties encountered testing with commercially-provided evaluation boards while attempting to classify the complex and varied failure modes of a modern 32-bit microcontroller. This work also describes some of the possible advantages to using off-the-shelf automotive-grade electronics for low-risk aerospace applications.

[发布日期] 2016-07-13

[学科分类] 电子与电气工程