Use of Commercial FPGA-Based Evaluation Boards for Single-Event Testing of DDR2 and DDR3 SDRAMs
[摘要] We investigate the use of commercial FPGA based evaluation boards for radiation testing DDR2 and DDR3 SDRAMs. We evaluate the resulting data quality and the tradeoffs involved in the use of these boards.
[发布日期] 2013-12-01 [发布机构]
[效力级别] [学科分类] 电子与电气工程
[关键词] [时效性]
