Single Event Effects in FPGA Devices 2015-2016

[摘要] This presentation provides an overview of single event effects in FPGA devices 2015-2016 including commercial Xilinx V5 heavy ion accelerated testing, Xilinx Kintex-7 heavy ion accelerated testing, mitigation study, and investigation of various types of triple modular redundancy (TMR) for commercial SRAM based FPGAs.

[发布日期] 2016-06-13

[学科分类] 电子与电气工程