Total Ionizing Dose Test Report BFR92A NPN 5 GHz Wide Band Transistor from NXP

[摘要] The purpose of this test was to characterize the Philips/NXP BFR92A NPN 5 gigahertz wide band silicon transistor for total dose response. This test shall serves as the radiation lot acceptance test (RLAT) for the lot date code (LDC) 1027. The BFR92A is packaged in a 3-pin plastic SOT23 package. Low dose rate (LDR/ELDRS) irradiations was performed.

[发布日期] 2011-08-01

[学科分类] 物理（综合）