A Method for Estimating the Probability of Floating Gate Prompt Charge Loss in a Radiation Environment

[摘要] Since advancing technology has been producing smaller structures in electronic circuits, the floating gates in modern flash memories are becoming susceptible to prompt charge loss from ionizing radiation environments found in space. A method for estimating the risk of a charge-loss event is given.

[发布日期] 2016-03-01

[学科分类] 电子与电气工程