Single-Event Transient Testing of the Crane Aerospace and Electronics SMHF2812D Dual DC-DC Converter

[摘要] The purpose of this testing was to characterize the Crane Aerospace & Electronics (Crane) Interpoint SMHF2812D for single-event transient (SET) susceptibility. These data shall be used for flight lot evaluation, as well as qualification by similarity of the SMHF family of converters, all of which use the same active components.

[发布日期] 2015-05-12

[学科分类] 电子与电气工程