NASA Electronic Parts and Packaging (NEPP) Program, Discussion of Highly Accelerated Life Testing (HALT) of Capacitors

[摘要] Highly Accelerated Life Testing (HALT) testing holds promise for affordable efficient acceptance testing of multi-layer ceramic chip capacitors (MLCCs) especially for commercial off the shelf (COTS).

[发布日期] 2017-02-02

[学科分类] 电子与电气工程