Ecloud Build-Up Simulations for the FNAL MI for a Mixed Fill Pattern: Dependence on Peak SEY and Pulse Intensity During the Ramp

[摘要] We present simulation results of the build-up of the electron-cloud density n{sub e} in three regions of the FNAL Main Injector (MI) for a beam fill pattern made up of 5 double booster batches followed by a 6th single batch. We vary the pulse intensity in the range N{sub t} = (2-5) x 10{sup 13}, and the beam kinetic energy in the range E{sub k} = 8-120 GeV. We assume a secondary electron emission model qualitatively corresponding to TiN, except that we let the peak value of the secondary electron yield (SEY) {delta}{sub max} vary as a free parameter in a fairly broad range. Our main conclusions are: (1) At fixed N{sub t} there is a clear threshold behavior of n{sub e} as a function of {delta}{sub max} in the range {approx} 1.1-1.3. (2) At fixed {delta}{sub max}, there is a threshold behavior of n{sub e} as a function of N{sub t} provided {delta}{sub max} is sufficiently high; the threshold value of N{sub t} is a function of the characteristics of the region being simulated. (3) The dependence on E{sub k} is weak except possibly at transition energy. Most of these results were informally presented to the relevant MI personnel in April 2010.

[发布日期] 2010-12-11

[关键词] 70;ELECTRON EMISSION;ELECTRONS;KINETIC ENERGY;PERSONNEL;SIMULATION