Mechanical and electro-mechanical reliability of transparent oxide thin films for flexible electronics applications
[摘要] Flexible electronic devices such as solar cells, touch panels and wearable displays have developed industrially and commercially in recent years because they are flexible and light weight at low cost. Since such devices constitute a brittle oxide layer applied to a polymer substrate, the cracking and/or film damage of the brittle inorganic coating when the device is under different mechanical and environmental loading during processing and service is one of the most important problems in the flexible electronic industry. This can lead to degradation and reduction in electrical functionality of the entire device; therefore, it is important to assess the behaviour of such layers under different mechanical deformation and environmental loads and to develop new mechanical testing for predicting reliability. This research focusses on the investigation of the reliability of two types of flexible components; indium gallium zinc oxide (IGZO), and Ag-alloy based indium tin oxide (ITO/Ag-alloy /ITO), that are typically used as a channel layer, and as an anode in thin film transistor and solar cell applications respectively. IGZO was deposited on both polyethylene terephthalate (PET) and polyethylene naphthalate (PEN) substrates for investigation including uniaxial tensile and buckling tests coupled with in situ confocal laser scanning microscopy. Ex situ scanning electron microscopy and atomic force microscopy were performed to investigate the cracking morphology of the IGZO films after testing. Furthermore, the electro-mechanical performance and corrosion resistance of ITO/Ag-alloy /ITO were investigated using in situ twisting tests, twisting fatigue, corrosion by aggressive salt environments, bending fatigue, bending fatigue-corrosion and long term bending under different temperature and humidity conditions.
[发布日期] [发布机构] University:University of Birmingham;Department:School of Metallurgy and Materials
[效力级别] [学科分类]
[关键词] T Technology;TK Electrical engineering. Electronics Nuclear engineering [时效性]