Single-layer model of reflective nanostructures for magneto- ellipsometry data analysis

[摘要] In this work we present the method of magneto-ellipsometry data analysis. Magneto- ellipsometry measurements are conducted in situ during nanostructures synthesis. Magnetic field is applied in configuration of magneto-optical transverse Kerr effect. Single-layer model of reflective nanostructures is in focus.

[发布机构] Reshetnev Siberian State Aerospace University, Krasnoyarsk; 660037, Russia^1;Siberian Federal University, Krasnoyarsk; 660041, Russia^2;Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk; 660036, Russia^3

[学科分类] 航空航天科学

[关键词] Ellipsometry measurements;Magneto-optical;Single-layer models