Impact of recombination on heavy ion induced single event upset cross-section

[摘要] The experimental dependence of the single event upset (SEU) cross-section versus linear energy transfer (LET) function in the nanoscale (with feature size less than 100 nm) memories is explained with the proposed recombination-limited charge yield, which is significantly dependent on LET.

[发布机构] National Research Nuclear University, MEPhI (Moscow Engineering Physics Institute), Kashirskoe shosse 31, Moscow; 115409, Russia^1

[关键词] Charge-yield;Feature sizes;Linear energy transfer;Nano scale;Single event upset cross sections