Simulating nanosecond voltage comparator with improved radiation hardness compatible with PECL logic
[摘要] The typical voltage comparator circuits are considered. Shown that the use of series- parallel connection of cascades improves the accuracy, speed and hardness to single event transient effects.
[发布日期] [发布机构] National Research Nuclear University, MEPhI (Moscow Engineering Physics Institute), Kashirskoe shosse 31, Moscow; 115409, Russia^1
[效力级别] [学科分类]
[关键词] Radiation hardness;Series parallel connection;Single event transients [时效性]