RF Pulse Signal Integrity Analysis for Nonlinear Ended Microstrip Line Atom-Probe Tomography

[摘要] A signal integrity (SI) analysis of high voltage rectangular short pulses for the atom- probe system is explored in this paper. The operated RF transient pulse is considered for exciting on material sample inside an ultra-high vacuum (UHV) cryogenic chamber. The ns- duration pulse signal is injected into the cryogenic analysis chamber through the transmitting system mainly constituted by a microstrip interconnect line ended by optical controlled nonlinear load. The whole system frequency characterization is performed based on the S- parameter measurements. As expected, a challenging ultra-short rectangular shape pulse is exhibited by the pulser. Promising experimental results with the improvement of ion mass spectrum is demonstrated with the designed RF pulser.

[发布机构] UMR CNRS 6634 - Normandy University GPM, Université and INSA de Rouen, Saint-Etienne-du-Rouvray, France^1;IRSEEM EA 4353, Graduate School of Engineering, ESIGELEC, Saint-Etienne-du-Rouvray, France^2

[关键词] Atom probe tomography;Cryogenic chamber;Interconnect lines;Optical-controlled;Rectangular shapes;S-Parameter measurements;Signal Integrity;System frequency