Far field imaging of a dielectric inclusion

[摘要] A non-iterative topological sensitivity framework for guaranteed far field detection of a dielectric inclusion is presented. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of resolution, stability, and signal-to-noise ratio.

[发布机构] Department of Mathematics, COMSATS Institute of Information Technology, Wah Cantt.; 47040, Pakistan^1;Weierstrass Institute for Applied Analysis and Stochastics, Leibniz Institute in Forschungsverbund Berlin E. V. (WIAS), Mohrenstr. 39, Berlin; 10117, Germany^2;Department of Mathematics and Statistics, FBAS, International Islamic University, Islamabad; 44000, Pakistan^3

[效力级别] 计算机科学 [学科分类] 计算机科学（综合）

[关键词] Dielectric inclusions;Far field;Far-field imaging;Far-field scattering;Fixed frequency;Multiple measurements;Non-iterative;Topological sensitivity