The XGS instrument on-board THESEUS

[摘要] Consolidated techniques used for space-borne X-ray and gamma-ray instruments are based on the use of scintillators coupled to Silicon photo-detectors. This technology associated with modern very low noise read-out electronics allows the design of innovative architectures able to reduce drastically the system complexity and power consumption, also with a moderate-to-high number of channels. These detector architectures can be exploited in the design of space instrumentation for gamma-spectroscopy with the benefit of possible smart background rejection strategies. We describe a detector prototype with 3D imaging capabilities to be employed in future gamma-ray and particle space missions in the 0.002-100 MeV energy range. The instrument is based on a stack of scintillating bars read out by Silicon Drift Detectors (SDDs) at both ends. The spatial segmentation and the crystal double-side readout allow a 3D position reconstruction with ∼3 mm accuracy within the full active volume, using a 2D readout along the two external faces of the detector. Furthermore, one of the side of SDDs can be used simultaneously to detect X-rays in the 2-30 keV energy range. The characteristics of this instrument make it suitable in next generation gamma-ray and particle space missions for Earth or outer space observations, and it will be briefly illustrated.

[发布机构] Department of Physics, University of Bologna, Viale Berti Pichat 6/2, Bologna; I-40127, Italy^1;INAF/IASF-Bologna, Via Gobetti 101, Bologna; I-40129, Italy^2;INFN - Sezione di Bologna, Viale Berti Pichat 6/2, Bologna; I-40127, Italy^3;INAF/IASF-Milano, Via Bassini 23, Milano; I-20133, Italy^4;INAF/IAPS, Via Fosso del Cavaliere 100, Roma; I-00133, Italy^5;CNR/IMM, Via Gobetti 101, Bologna; I-40129, Italy^6;Department of Physics, University of Ferrara, Via Giuseppe Saragat 1, Ferrara; I-44122, Italy^7;INFN - Sezione di Trieste, Padriciano 99, Trieste; I-34127, Italy^8;Mathematics and Informatics Dept., Udine University, Via delle Scienze 206, Udine; I- 33100, Italy; (10) TIFPA Dept., Via Sommarive 14, Povo TN; 38123, Italy; (11) CMM Dept., Burno Kessler Foundation (FBK), Via Sommarive 18, Povo; I-38123, Italy^9

[效力级别] 工业技术 [学科分类] 工业工程学

[关键词] Background rejection;Gamma spectroscopy;Readout Electronics;Silicon Drift Detector;Silicon photo-detector;Space instrumentations;Spatial segmentation;System complexity