Structural and optical properties analysis of MoS2 nanoflakes on quartz substrate as prepared by mechanical exfoliation

[摘要] We study the structural and optical properties of MoS2nanoflakes on quartz substrate as prepared by mechanical exfoliation method. The structural and morphological properties of MoS2nanoflakes were characterized by SEM, EDS, and XRD, while the high-resolution spectroscopic ellipsometry (SE) with the photon energy of 1.27 to 6.53 eV is used to study its optical characteristics. As the results, SEM data shows that MoS2appears to be nanoflakes covering around 25-35% on the surface of quartz substrate, and XRD spectra shows the dominant orientation along c-axis (002). Based on spectroscopic ellipsometry analysis, the average thickness of MoS2nanoflakes is around 12 nm or about 6-8 layers. By using Tauc plot method, we confirm that MoS2 nanoflakes have a semiconductor characteristic with the optical bandgap as high as 1.68 eV. Our study shows the important of structural and optical properties of MoS2nanoflakes that can be utilized for future optoelectronic devices and energy-harvesting purposes.

[发布机构] Quantum Semiconductor and Devices Laboratory, Department of Physics, Bandung Institute of Technology, Bandung; 40132, Indonesia^1

[效力级别] 物理学

[关键词] Dominant orientation;High resolution;Mechanical exfoliation;Optical characteristics;Photon energy;Quartz substrate;Structural and morphological properties;Structural and optical properties