Using Spice Circuit Simulation Program in Reliability Analysis ofRedundant Systems with Non-Repairable Units and Common-CauseFailures

[摘要] The effectiveness of Simulation Program with Integrated Circuit Emphasis (SPICE) in calculating probabilities, reliability, steady-state availability and mean-time to failure of redundant systems with non-repairable units and common-cause failures described by Markov models is demonstrated. General equations and procedure for constructing the equivalent circuit forNparallel units are presented. Results obtained, forN=1,2,3, using SPICE are compared with previously published results obtained using the Laplace transform method. Full SPICE listings are included.

[学科分类] 电子、光学、磁材料