A New Statistical Methodfor Maximum Power Estimationin CMOS VLSI Circuits

[摘要] A method for maximum power estimation in CMOS VLSI circuits is proposed. Themethod is based on extreme value theory and allows for the calculation of the upper endpoint of the probability distribution which is followed by the instantaneous power drawnfrom the supply bus. The main features of the method are the relatively small and circuitin-dependentsubset of input patterns required for accurate prediction of maximumpower and its simulative nature which ensures that no over-simplifying assumptions aremade. Application of the proposed method to eight distributions, which come close tothe behavior of power consumption in VLSI circuits, proved its superior capabilitieswith respect to existing methods.

[学科分类] 电子、光学、磁材料