Technical Note: An investigation of chaos in theRL-diode circuit using the BDS test

[摘要] In this paper, RL-diode circuit driven by a sinusoidal voltage is employed to obtain nonlinear experimental data. The BDS test statistic is used to analyse these data. According tothe results of the analysis for the first differenced order data, chaotic structure has been found foreachevalues.

[学科分类] 自然科学（综合）